|  Don
E. Bray, Inc.: StressMap(TM) is a technique for mapping
stress fields in metals using the critically refracted longitudinal
(LCR) wave. Gradients can be evaluated using different frequencies.
The StressMap(TM) system is able to achieve very high travel-time
resolution, enabling superior details on the stress fields.
Three patents have recently been awarded for the LCR technique
for stress measurement.
The textbook Nondestructive Evaluation by
Don E. Bray and Rod K. Stanley offers physical fundamentals
as well as applications in the most common NDE methods.
It has been a leader for almost 15 years, with ample examples
and problems.
For more information, contact us:
Don E. Bray, Ph.D., P.E.
Don E. Bray, Inc.
1601 Fontaine Street
P. O. Box 10315
College Station, TX 77842-0315 USA
Tel: 979-492-9534
Fax: 979-693-1620
E-mail: debray1@brayengr.com
Web Site: http://www.brayengr.com/ |
